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Electron Microscopy and Analysis 1993, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Liverpool, 14-17 September 1993 (Institute of Physics Conference Series)
Craven, A. J./Institute of Physics (Great Britain) Electron Microscopy and Analysis Group/Royal Microscopical Society (Great Britain)/Institute of Materials (London, England)
Structure and Properties of Dislocations in Semiconductors 1989, Proceedings of the 6th INT Symposium, Oxford, April 1989 (Institute of Physics Conference Series)
International Symposium on the Structure and Properties of Dislocations in Semiconductors (6th : 1989 : University of Oxford)/Holt, D. B./Roberts, S. G./Wilshaw, P. R./Wilshaw, P. R.