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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering)
Murr, Lawrence E
Helium Ion Microscopy: Principles and Applications (SpringerBriefs in Materials)
Joy, David C.
Microscopy and Microanalysis for Lithium-Ion Batteries
Shen, Cai
Progress in Nanoscale Characterization and Manipulation (Springer Tracts in Modern Physics, 272)
Wang, Rongming／Wang, Chen／Zhang, Hongzhou／Tao, Jing／Bai, Xuedong
Atomic-Scale Analytical Tomography: Concepts and Implications (Advances in Microscopy and Microanalysis)
Kelly, Thomas F.／Gorman, Brian P.／Ringer, Simon P.
Microstructural Characterization of Materials, 2nd Edition
Brandon, David
Quantitative Microbeam Analysis: Proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992. A NATO Advanced Study Institute. (Scottish Graduate Series)
Fitzgerald, A.G
Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein, Joseph I.／Newbury, Dale E.／Michael, Joseph R.／Ritchie, Nicholas W.M.／Scott, John Henry J.／Joy, David C.
Transmission Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
Reimer, Ludwig／Hawkes, Peter W
Scanning electron microscopy and X-ray microanalysis
EchlinPatrick／著 JoyD.C.／著 LifshinEric／著 LymanCharlesE.(LehighUniversityBethlehemPAUSA)／著 ほか

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